ONEM

Optical Near-field electron microscopy is a new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.

A detailed description of the proposal can be found here.

17.10.2024
 

The minimal membrane requirements for BAX-induced pore opening upon exposure to oxidative stress
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20.08.2024
 

A camera in Salzkammergut captures a photo with a 1000-year long exposure time!
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27.06.2024
 

Unified Simulation Platform for Interference Microscopy
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13.06.2024
 

Growth of ultra-flat ultra-thin alkali antimonide photocathode films
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11.06.2024
 

Exhibition at the European Capitol of Culture 2024!
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11.06.2024
 

Our PhD student Hanieh Jafarian at MIT doing her secondment.

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